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Switch Test

Make, break, or change the connection of a circuit.


Showing results: 901 - 915 of 965 items found.

  • PXI High-Density Multiplexer: 64-ch, 2-Wire, 100Vrms/1A, Reed Relays

    M9101A - Keysight Technologies

    The M9101A, a high-density, 64-channel PXI multiplexer routes many different channels to a single point. The switches operate in a break-before-make mode that ensures no two points are connected at the same time or, if needed multiple channels can connect simultaneously. Ideal for routing multiple analog signals to a measurement device in automated test environment (ATE) or data acquisition systems. Each channel switches a high and a low for 2-wire switching up to 100Vrms, with up to 10W of power. Connection options include the durable connector block or the standard cable connections.

  • Custom Test Systems

    ATE Systems

    ATE Systems has developed a wide variety of custom test systems that integrate commercial test instruments and custom hardware, tied together with a test executive. Examples of the types of tests that have been incorporated include: S-parameters (gain, return loss, VSWR, etc), Noise figure, Power, Spectral response, Linearity, Voltage, Current, Switching speed and so on

  • Configurable Microwave and Optical Witching Platform

    1257 - Astronics Corporation

    The Astronics 1257 switching system is a high-performance switching and control system available in 4U, 5U, or 6U rack-mountable packages. The unit draws upon our four decades of experience as a major automated test equipment (ATE) switching supplier to set a new standard in switching systems.

  • High Performance Analog & Mixed Signal Test Solutions

    Applicos - Salland Engineering

    Effective mixed-signal test solutions demand know-how and experience. Low level analog signals need to be stimulated and analyzed near fast switching digital logic. Cross talk, magnetic fields, clock jitter, ground noise and non-linearity of components, are just a few of the problems that must be addressed. Applicos knows what it takes to design and produce high quality mixed-signal test solutions. They have been servicing the mixed-signal test industry since 1993 and have established a distinguished reputation for providing our customers with high performance, cost effective solutions. In 2018 we acquired Applicos B.V. to extend our portfolio for the ATE business.

  • Impact Test Apparatus

    IT-50 - Lumetronics

    Impact test is an essential physical test prescribed in many standards to test samples for mechanical shock. It is designed to perform such tests. The test is carried out to ensure that the test items have adequate mechanical strength to withstand the stresses and rough handling imposed during installation and use. It is adapted to test various types of electrical accessories such as switches, sockets, plugs, starter seats and other electrical appliances.

  • Conductor Damage Test Set

    CD-2M - Lumetronics

    Is designed to carry out tests specified for Switches used for Domestic and similar applications as included under IS:3854:1997. It is used to ensure that Screwtype terminals of switches are such that they clamp the conductor without causing undue damage to the conductor strands. It is a compact and robust andequipment housed in a bench top enclosure. The CD-2M is motorized to allow easy operation. The Instrument is designed to meet the requirements of IS:3854:1997 and other related specifications.

  • Complete Set of 1200KV/2400KV/4800KV Impulse Voltage Generators

    Shanghai Launch Electric Co., Ltd.

    The series impulse voltage generators are used for the impulse voltage tests of lightning impulse full wave, lightning impulse chopping, switching impulse voltage wave and steep wave, so as to check the insulation performances.

  • Test Switches

    RTS - STATES®

    STATES Type RTS Test Switches are designed to simplify and speed testing and check-out of relay, control and instrumentation systems. They eliminate the need to change connections and prevent open-circuiting CTs during tests.

  • PXIe Vector Signal Generator: 1 MHz to 3 GHz or 6 GHz

    M9381A - Keysight Technologies

    Choose your RF modulation bandwidth, 40, 100, or 160 MHz, and easily upgrade as test needs change Increase throughput with fastest RF frequency tuning and amplitude switching for high-speed automated test Save space with a compact solution for up to 8x8 MIMO with phase coherence Get up and running quickly with validated application-specific reference solutions Simplify signal creation with Keysight's Signal Studio and Waveform Creator

  • PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit

    786888-01 - NI

    PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.

  • PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit

    782435-01 - NI

    PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.

  • Test Switches

    STATES®

    Designed and manufactured to allow quick and easy multi-circuit testing of switchboard relays, meters and instruments by any conventional system.

  • Software

    TOELLNER-wavecontrol - Toellner Electronic Instrumente GmbH

    The Software TOELLNER-WaveControl provides waveforms and controls the TOELLNER system components at the test station, which can be individually tailored to your requirements. Using a DAQ-Card, any signal waveform can be provided with Arbitrary Power Supplies or 4-Quadrant Amplifiers with outputs from 160 W to 5200 W. For fast interruptions, TOELLNER offers electronic switches with switching times below 500 ns.

  • PXIe-4140, 4-Channel Source Measure Unit

    781742-01 - NI

    The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.

  • Agile Signal Generators (UXG)

    XSeries - Keysight Technologies

    Get a powerful building block, whether you need a dependable LO or a scalable threat simulator More accurately simulate multi-emitter scenarios for radar, EW and antenna test with the fastest switching, phase coherency, and extensive pulse-modulation Test sooner and increase confidence in EW system performance by generating complex signal simulations when you need them Increase the reliability of your test system: the UXG is a slide-in replacement for legacy fast-switching sources

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